Analysis of strain transfer through the Mg/Ti interface using crystallographic orientation analysis based on electron back-scattered diffraction patterns

Hiroaki Kawamoto, Seiji Miura, Kaori Yano, Kenji Ohkubo, Tetsuo Mohri

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

Improvement of deformability for Mg-based composite materials with a dispersion of Ti particles has been considered in terms of the strain transfer through the interface, but is not fully understood during the deformation of ductile Ti particles. Mg-based composites composed of pure Mg and pure Ti plates was investigated to clarify the strain transfer through the Mg/Ti interface using crystallographic orientation analysis based on electron back-scattered diffraction (EBSD) patterns. It is suggested that the larger Schmid factor and lower residual strain energy (W) are significant for the operation of a prismatic slip system in the Ti grains.

Original languageEnglish
Pages (from-to)1107-1111
Number of pages5
JournalMaterials Transactions
Volume49
Issue number5
DOIs
Publication statusPublished - 2008 May

Keywords

  • Bending test
  • Electron back-scattered diffraction
  • Twinning

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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