TY - JOUR
T1 - Analysis of polarization interference-type bpf arrays for nir spectroscopic imaging utilizing all-dielectric planar chiral metamaterials
AU - Ohtera, Yasuo
AU - Yu, Jiyao
AU - Yamada, Hirohito
N1 - Funding Information:
Y. O. would like to thank Professor Junji Yamauchi at Hosei University for his fruitful comments and continuous encouragement. This work has been in part supported by CASIO science promotion foundation.
Publisher Copyright:
© 2018, Electromagnetics Academy. All rights reserved.
PY - 2018
Y1 - 2018
N2 - We investigated the potential application of planar chiral metamaterials (PCMs) to near infrared wavelength filters for multispectral measurement through electromagnetic simulation. PCM assumed here was a two-dimensional sub-wavelength surface grating on a high index film with chiral unit cells. The PCM exhibits optical activity (OA) for normally incident light at a finite wavelength range. Thus, by sandwiching the PCM with a pair of linear polarizers, a polarization interference-type BPF can be constructed. We focused on an all-dielectric PCM consisting of a silicon chiral layer and a dielectric underclad layer on a silica substrate. Wavelength filtering characteristics with different bandwidths have been verified for several underclad materials such as Si3N4,Al2O3, and Si.
AB - We investigated the potential application of planar chiral metamaterials (PCMs) to near infrared wavelength filters for multispectral measurement through electromagnetic simulation. PCM assumed here was a two-dimensional sub-wavelength surface grating on a high index film with chiral unit cells. The PCM exhibits optical activity (OA) for normally incident light at a finite wavelength range. Thus, by sandwiching the PCM with a pair of linear polarizers, a polarization interference-type BPF can be constructed. We focused on an all-dielectric PCM consisting of a silicon chiral layer and a dielectric underclad layer on a silica substrate. Wavelength filtering characteristics with different bandwidths have been verified for several underclad materials such as Si3N4,Al2O3, and Si.
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U2 - 10.2528/PIERM17112707
DO - 10.2528/PIERM17112707
M3 - Article
AN - SCOPUS:85045677163
VL - 66
SP - 1
EP - 10
JO - Progress In Electromagnetics Research M
JF - Progress In Electromagnetics Research M
SN - 1937-8726
ER -