ANALYSIS OF MULTIPLE LAYER SURFACE FILMS BY MODULATED REFLECTION SPECTROSCOPY.

N. Hara, K. Sugimoto

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

Methods for qualitative and quantitative analyses of thin multiple layer surface films by modulated reflection spectroscopy have been studied using single- and two-layer films of gamma -Fe//2O//3 and Cr//2O//3 and single-layer films of composite oxide of Fe//2O//3-Cr//2O//3 prepared by CVD technique. The application of the methods to the in situ analysis of passive films is demonstrated on Fe-Cr alloys in solutions. (Author abstract. )

Original languageEnglish
Title of host publicationThin Films Science and Technology
PublisherElsevier
Pages211-216
Number of pages6
ISBN (Print)0444422528, 9780444422521
DOIs
Publication statusPublished - 1983

Publication series

NameThin Films Science and Technology
ISSN (Print)0168-2075

ASJC Scopus subject areas

  • Engineering(all)

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