Analysis of mechanical properties of polymer ABC by atomic force microscopy

Hideyuki Nukaga, So Fujinami, Hiroyuki Watabe, Ken Nakajima, Toshio Nishi

    Research output: Contribution to conferencePaperpeer-review

    Abstract

    AFM has an advantage of obtaining topographic and mechanical properties at the same time. In analyzing the force curve using Hertz theories, elastic modulus was obtained with nanometer-scale resolution. Furthermore, sample deformation by the force exerted was also estimated from the force curve analyses. We can reconstruct a real topographic image by incorporating apparent height with deformation image. We apply this method for obtaining information about mechanical properties of a polymer ABC. We show the detail of this procedure and new information about polymer ABC.

    Original languageEnglish
    Pages3295-3296
    Number of pages2
    Publication statusPublished - 2005 Dec 1
    Event54th SPSJ Symposium on Macromolecules - Yamagata, Japan
    Duration: 2005 Sep 202005 Sep 22

    Other

    Other54th SPSJ Symposium on Macromolecules
    CountryJapan
    CityYamagata
    Period05/9/2005/9/22

    Keywords

    • Atomic force microscopy
    • Force-distance curve
    • Polymer ABC
    • Real topographic image
    • Young's modulus image

    ASJC Scopus subject areas

    • Engineering(all)

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