Abstract
AFM has an advantage of obtaining topographic and mechanical properties at the same time. In analyzing the force curve using Hertz theories, elastic modulus was obtained with nanometer-scale resolution. Furthermore, sample deformation by the force exerted was also estimated from the force curve analyses. We can reconstruct a real topographic image by incorporating apparent height with deformation image. We apply this method for obtaining information about mechanical properties of a polymer ABC. We show the detail of this procedure and new information about polymer ABC.
Original language | English |
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Pages | 3295-3296 |
Number of pages | 2 |
Publication status | Published - 2005 Dec 1 |
Event | 54th SPSJ Symposium on Macromolecules - Yamagata, Japan Duration: 2005 Sep 20 → 2005 Sep 22 |
Other
Other | 54th SPSJ Symposium on Macromolecules |
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Country/Territory | Japan |
City | Yamagata |
Period | 05/9/20 → 05/9/22 |
Keywords
- Atomic force microscopy
- Force-distance curve
- Polymer ABC
- Real topographic image
- Young's modulus image
ASJC Scopus subject areas
- Engineering(all)