Analysis of mechanical properties of polymer ABC by atomic force microscopy

Hideyuki Nukaga; So Fujinami; Hiroyuki Watabe; Ken Nakajima; Toshio Nishi

Analysis of mechanical properties of polymer ABC by atomic force microscopy

Hideyuki Nukaga, So Fujinami, Hiroyuki Watabe, Ken Nakajima, Toshio Nishi

Research output: Contribution to conference › Paper › peer-review

Abstract

AFM has an advantage of obtaining topographic and mechanical properties at the same time. In analyzing the force curve using Hertz theories, elastic modulus was obtained with nanometer-scale resolution. Furthermore, sample deformation by the force exerted was also estimated from the force curve analyses. We can reconstruct a real topographic image by incorporating apparent height with deformation image. We apply this method for obtaining information about mechanical properties of a polymer ABC. We show the detail of this procedure and new information about polymer ABC.

Original language	English
Pages	3295-3296
Number of pages	2
Publication status	Published - 2005 Dec 1
Event	54th SPSJ Symposium on Macromolecules - Yamagata, Japan Duration: 2005 Sep 20 → 2005 Sep 22

Other

Other	54th SPSJ Symposium on Macromolecules
Country	Japan
City	Yamagata
Period	05/9/20 → 05/9/22

Keywords

Atomic force microscopy
Force-distance curve
Polymer ABC
Real topographic image
Young's modulus image

ASJC Scopus subject areas

Engineering(all)

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title = "Analysis of mechanical properties of polymer ABC by atomic force microscopy",

abstract = "AFM has an advantage of obtaining topographic and mechanical properties at the same time. In analyzing the force curve using Hertz theories, elastic modulus was obtained with nanometer-scale resolution. Furthermore, sample deformation by the force exerted was also estimated from the force curve analyses. We can reconstruct a real topographic image by incorporating apparent height with deformation image. We apply this method for obtaining information about mechanical properties of a polymer ABC. We show the detail of this procedure and new information about polymer ABC.",

keywords = "Atomic force microscopy, Force-distance curve, Polymer ABC, Real topographic image, Young's modulus image",

author = "Hideyuki Nukaga and So Fujinami and Hiroyuki Watabe and Ken Nakajima and Toshio Nishi",

year = "2005",

month = dec,

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language = "English",

pages = "3295--3296",

note = "54th SPSJ Symposium on Macromolecules ; Conference date: 20-09-2005 Through 22-09-2005",

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T1 - Analysis of mechanical properties of polymer ABC by atomic force microscopy

AU - Nukaga, Hideyuki

AU - Fujinami, So

AU - Watabe, Hiroyuki

AU - Nakajima, Ken

AU - Nishi, Toshio

PY - 2005/12/1

Y1 - 2005/12/1

N2 - AFM has an advantage of obtaining topographic and mechanical properties at the same time. In analyzing the force curve using Hertz theories, elastic modulus was obtained with nanometer-scale resolution. Furthermore, sample deformation by the force exerted was also estimated from the force curve analyses. We can reconstruct a real topographic image by incorporating apparent height with deformation image. We apply this method for obtaining information about mechanical properties of a polymer ABC. We show the detail of this procedure and new information about polymer ABC.

AB - AFM has an advantage of obtaining topographic and mechanical properties at the same time. In analyzing the force curve using Hertz theories, elastic modulus was obtained with nanometer-scale resolution. Furthermore, sample deformation by the force exerted was also estimated from the force curve analyses. We can reconstruct a real topographic image by incorporating apparent height with deformation image. We apply this method for obtaining information about mechanical properties of a polymer ABC. We show the detail of this procedure and new information about polymer ABC.

KW - Atomic force microscopy

KW - Force-distance curve

KW - Polymer ABC

KW - Real topographic image

KW - Young's modulus image

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T2 - 54th SPSJ Symposium on Macromolecules

Y2 - 20 September 2005 through 22 September 2005

ER -