Analysis of lattice defects in an epitaxial PbTiO3 thick film by transmission electron microscopy

Kenta Aoyagi, Takanori Kiguchi, Yoshitaka Ehara, Hiroshi Funakubo, Toyohiko J. Konno

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The microstructure of an epitaxial PbTiO3 thick film was investigated by using transmission electron microscopy (TEM). An analysis of bright-field TEM (BFTEM) images revealed the existence of displacements along the [001] direction of PbTiO3. High-resolution TEM (HRTEM) observation indicated that stacking faults parallel to the (001) plane of PbTiO3 are formed in the thick film. Local strain fields around the stacking faults were quantified by geometric phase analysis of the HRTEM image. The measured strain suggested the presence of a pair of extrinsic and intrinsic stacking faults. The distance between an extrinsic stacking fault and an intrinsic one corresponds to two unit cells along the [001] direction of PbTiO3. The formation of these stacking faults is considered to be associated with the strain relaxation of the film.

Original languageEnglish
Title of host publicationElectroceramics in Japan XV
PublisherTrans Tech Publications Ltd
Pages171-174
Number of pages4
ISBN (Print)9783037857618
DOIs
Publication statusPublished - 2013
Event31st Electronics Division Meeting of the Ceramic Society of Japan - Tokyo, Japan
Duration: 2011 Oct 282011 Oct 29

Publication series

NameKey Engineering Materials
Volume566
ISSN (Print)1013-9826
ISSN (Electronic)1662-9795

Other

Other31st Electronics Division Meeting of the Ceramic Society of Japan
Country/TerritoryJapan
CityTokyo
Period11/10/2811/10/29

Keywords

  • Ferroelectrics
  • Thin film
  • Transmission electron microscopy

ASJC Scopus subject areas

  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering

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