Analysis of defects formation and mobility during ion irradiation by coherent precipitates

Zheng Cao Li, Hiroaki Abe, Naoto Sekimura

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

Transmission electron microscopy observation of cross-sectional specimens prepared by focused ion beam milling method have been applied to study the deep radiation damage and depth profile of point defects generated during ion irradiation in Cu-1 mass%Co alloy specimens by means of coherent precipitates. The specimens were irradiated at a temperature range of 250 to 500' C by 4 and 0.6 MeV self Cu ions to a dose of 0.3 dpa. The damage range has been observed at depths well beyond that expected from ion damage range calculations.

Original languageEnglish
Pages (from-to)259-262
Number of pages4
JournalMaterials Transactions
Volume47
Issue number2
DOIs
Publication statusPublished - 2006 Feb

Keywords

  • Depth profile
  • Ion irradiation
  • Point defect

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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