Analysis of crystallographic orientation of elongated β-Si3N4 particles in In Situ Si3N4 composite by electron back scattered diffraction method

Yoshiyuki Yasutomi, Yoshihisa Sakaida, Naoto Hirosaki, Yuichi Ikuhara

    Research output: Contribution to journalArticlepeer-review

    2 Citations (Scopus)

    Abstract

    Electron back scattered diffraction (EBSD) method was applied to examine the crystallographic orientation of ceramics, microstructure on a large scale. This method is given in altermotive to transmission electron microscopy, which gives information limited to a narrow portion of the specimen. To prove that the EBSD method can be applied to analyze the crystallographic orientation of ceramics, we have verified the crystallographic orientation of single crystal ceramics of cubic and corundum structures using a field emission scanning electron microscopy (FE-SEM) coupled with an orientation imaging microscopy analysis device. Then, also the crystallographic orientation of in situ Si3N4 composite was analyzed by the EBSD method. Results of the EBSD characterization showed that in Si3N4 ceramics of hexagonal structure the elongated Si3N4 particles grew in the alignment direction of seed grains. The growth direction and the side planes of the elongated Si3N4 particles were influenced by both the alignment of seed grains and by the hotpressing pressure.

    Original languageEnglish
    Pages (from-to)980-983
    Number of pages4
    JournalJournal of the Ceramic Society of Japan
    Volume106
    Issue number10
    DOIs
    Publication statusPublished - 1998 Oct

    Keywords

    • Crystallographic orientation
    • Electron back scattered diffraction analysis
    • Elongated SiN particles
    • MgO
    • Microstructure
    • Sapphire
    • SiN ceramics
    • Silicon
    • Single crystal

    ASJC Scopus subject areas

    • Ceramics and Composites
    • Chemistry(all)
    • Condensed Matter Physics
    • Materials Chemistry

    Fingerprint

    Dive into the research topics of 'Analysis of crystallographic orientation of elongated β-Si<sub>3</sub>N<sub>4</sub> particles in In Situ Si<sub>3</sub>N<sub>4</sub> composite by electron back scattered diffraction method'. Together they form a unique fingerprint.

    Cite this