Analysis of broken symmetry in convergent-beam electron diffraction along (112̄0) and (11̄00) zone-axes of AlN for polarity determination

Masataka Imura, Ujjal Gautam, Kiyomi Nakajima, Yasuo Koide, Hiroshi Amano, Kenji Tsuda

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

To accurately and easily determine the polarity of AlN using transmission electron microscopy, we compare the convergent-beam electron diffraction (CBED) patterns along the widely used (112̄0) and (11̄00) zone-axes. For the h112̄0i zone-axis, the diffraction disk of g = 0002 differs from that of g = 0002̄, while for (11̄00), the diffraction disks of g = 0002 and 0002̄ are similar. The preferential clarity of these two disks is explained using Bloch-wave dynamical theory. To further support the explanation, we compare the results of GaN case. On the basis of our analysis, we conclude that the CBED patterns of the (112̄0) zone-axis are more useful for accurately determining AlN polarity compared to the CBED patterns along the (11̄00) zone-axis.

Original languageEnglish
Article number08JE15
JournalJapanese journal of applied physics
Volume52
Issue number8 PART 2
DOIs
Publication statusPublished - 2013 Aug

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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