TY - GEN
T1 - Analysis of Active Learning suitability of subjects in information and electronics for computing education
AU - Takahashi, Akiko
AU - Kashiwaba, Yasuhiro
AU - Hayakawa, Yoshihiro
AU - Kubota, Yoshikatsu
AU - Yajima, Kuniaki
N1 - Publisher Copyright:
© 2016 IEEE.
Copyright:
Copyright 2017 Elsevier B.V., All rights reserved.
PY - 2017/2/10
Y1 - 2017/2/10
N2 - 'Active Learning (AL),' the teaching method which puts more emphasis on students' active participation in class and their abilities to discover problems and solve them, has been coming under the spotlight worldwide. We are promoting AL in the field of information and electronics. Especially, we are practicing A3 Learning System specializing in utilizing computers. We have aggressively introduced AL in class and seen the good effects of them. However, some problems are emerging in a certain type of subjects, which may mean that there are subjects unsuitable for AL. In this paper we report large-scale analysis of introduction of AL in information and electronics field and suggest that successful introduction of AL in class depends on the type of subjects.
AB - 'Active Learning (AL),' the teaching method which puts more emphasis on students' active participation in class and their abilities to discover problems and solve them, has been coming under the spotlight worldwide. We are promoting AL in the field of information and electronics. Especially, we are practicing A3 Learning System specializing in utilizing computers. We have aggressively introduced AL in class and seen the good effects of them. However, some problems are emerging in a certain type of subjects, which may mean that there are subjects unsuitable for AL. In this paper we report large-scale analysis of introduction of AL in information and electronics field and suggest that successful introduction of AL in class depends on the type of subjects.
KW - Active Learning
KW - analysis
KW - computing education
KW - suitability
UR - http://www.scopus.com/inward/record.url?scp=85015159890&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85015159890&partnerID=8YFLogxK
U2 - 10.1109/TALE.2016.7851802
DO - 10.1109/TALE.2016.7851802
M3 - Conference contribution
AN - SCOPUS:85015159890
T3 - Proceedings of 2016 IEEE International Conference on Teaching, Assessment and Learning for Engineering, TALE 2016
SP - 249
EP - 255
BT - Proceedings of 2016 IEEE International Conference on Teaching, Assessment and Learning for Engineering, TALE 2016
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2016 IEEE International Conference on Teaching, Assessment and Learning for Engineering, TALE 2016
Y2 - 7 December 2016 through 9 December 2016
ER -