An X-Ray Diffraction Study of Martensitic Transformation in Ti-Doped Nb3Sn

Yousuke Watanabe; Naoki Toyota; Tetsuo Inoue; Hiroshi Komatsu; Hiroshi Iwasaki

doi:10.1143/JJAP.27.2218

An X-Ray Diffraction Study of Martensitic Transformation in Ti-Doped Nb₃Sn

Yousuke Watanabe, Naoki Toyota, Tetsuo Inoue, Hiroshi Komatsu, Hiroshi Iwasaki

SCI - Physics

Research output: Contribution to journal › Article

10 Citations (Scopus)

Abstract

The effect of titanium addition on the martensitic transformation in Nb₃Sn was investigated by low-temperature X-ray diffraction using small-sized (0.1–0.3 mm) high-quality single crystals. It has been found that addition of 0.2 at.% Ti lowers the transformation temperature, T_mby 3 K while further addition up to 1.5 at.% suppresses the transformation. T_mis very sensitive to the manner of sample adhesion to the cold end of the cryostat and it rises nearly to ambient temperature if improperly adhered. The axial ratio a/c of the 0.2 at.% Ti doped alloy was measured to be 1.001 at 30 K, which compares to a value of 1.005 for the undoped alloy. A tendency to form a single tetragonal domain with decreasing temperature through T_mfor the 0.2 at.% Ti doped alloy was observed.

Original language	English
Pages (from-to)	2218-2223
Number of pages	6
Journal	Japanese journal of applied physics
Volume	27
Issue number	12R
DOIs	https://doi.org/10.1143/JJAP.27.2218
Publication status	Published - 1988 Dec

Keywords

A15 compound
Low temperature
Martensitic transformation
Superconductor
X-ray diffraction

ASJC Scopus subject areas

Engineering(all)
Physics and Astronomy(all)

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Watanabe, Y., Toyota, N., Inoue, T., Komatsu, H., & Iwasaki, H. (1988). An X-Ray Diffraction Study of Martensitic Transformation in Ti-Doped Nb₃Sn. Japanese journal of applied physics, 27(12R), 2218-2223. https://doi.org/10.1143/JJAP.27.2218

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title = "An X-Ray Diffraction Study of Martensitic Transformation in Ti-Doped Nb3Sn",

abstract = "The effect of titanium addition on the martensitic transformation in Nb3Sn was investigated by low-temperature X-ray diffraction using small-sized (0.1–0.3 mm) high-quality single crystals. It has been found that addition of 0.2 at.% Ti lowers the transformation temperature, Tmby 3 K while further addition up to 1.5 at.% suppresses the transformation. Tmis very sensitive to the manner of sample adhesion to the cold end of the cryostat and it rises nearly to ambient temperature if improperly adhered. The axial ratio a/c of the 0.2 at.% Ti doped alloy was measured to be 1.001 at 30 K, which compares to a value of 1.005 for the undoped alloy. A tendency to form a single tetragonal domain with decreasing temperature through Tmfor the 0.2 at.% Ti doped alloy was observed.",

keywords = "A15 compound, Low temperature, Martensitic transformation, Superconductor, X-ray diffraction",

author = "Yousuke Watanabe and Naoki Toyota and Tetsuo Inoue and Hiroshi Komatsu and Hiroshi Iwasaki",

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AU - Watanabe, Yousuke

AU - Toyota, Naoki

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AU - Komatsu, Hiroshi

AU - Iwasaki, Hiroshi

PY - 1988/12

Y1 - 1988/12

N2 - The effect of titanium addition on the martensitic transformation in Nb3Sn was investigated by low-temperature X-ray diffraction using small-sized (0.1–0.3 mm) high-quality single crystals. It has been found that addition of 0.2 at.% Ti lowers the transformation temperature, Tmby 3 K while further addition up to 1.5 at.% suppresses the transformation. Tmis very sensitive to the manner of sample adhesion to the cold end of the cryostat and it rises nearly to ambient temperature if improperly adhered. The axial ratio a/c of the 0.2 at.% Ti doped alloy was measured to be 1.001 at 30 K, which compares to a value of 1.005 for the undoped alloy. A tendency to form a single tetragonal domain with decreasing temperature through Tmfor the 0.2 at.% Ti doped alloy was observed.

AB - The effect of titanium addition on the martensitic transformation in Nb3Sn was investigated by low-temperature X-ray diffraction using small-sized (0.1–0.3 mm) high-quality single crystals. It has been found that addition of 0.2 at.% Ti lowers the transformation temperature, Tmby 3 K while further addition up to 1.5 at.% suppresses the transformation. Tmis very sensitive to the manner of sample adhesion to the cold end of the cryostat and it rises nearly to ambient temperature if improperly adhered. The axial ratio a/c of the 0.2 at.% Ti doped alloy was measured to be 1.001 at 30 K, which compares to a value of 1.005 for the undoped alloy. A tendency to form a single tetragonal domain with decreasing temperature through Tmfor the 0.2 at.% Ti doped alloy was observed.

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KW - Low temperature

KW - Martensitic transformation

KW - Superconductor

KW - X-ray diffraction

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