An X-Ray Diffraction Study of Martensitic Transformation in Ti-Doped Nb3Sn

Yousuke Watanabe, Naoki Toyota, Tetsuo Inoue, Hiroshi Komatsu, Hiroshi Iwasaki

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10 Citations (Scopus)


The effect of titanium addition on the martensitic transformation in Nb3Sn was investigated by low-temperature X-ray diffraction using small-sized (0.1–0.3 mm) high-quality single crystals. It has been found that addition of 0.2 at.% Ti lowers the transformation temperature, Tmby 3 K while further addition up to 1.5 at.% suppresses the transformation. Tmis very sensitive to the manner of sample adhesion to the cold end of the cryostat and it rises nearly to ambient temperature if improperly adhered. The axial ratio a/c of the 0.2 at.% Ti doped alloy was measured to be 1.001 at 30 K, which compares to a value of 1.005 for the undoped alloy. A tendency to form a single tetragonal domain with decreasing temperature through Tmfor the 0.2 at.% Ti doped alloy was observed.

Original languageEnglish
Pages (from-to)2218-2223
Number of pages6
JournalJapanese journal of applied physics
Issue number12R
Publication statusPublished - 1988 Dec
Externally publishedYes


  • A15 compound
  • Low temperature
  • Martensitic transformation
  • Superconductor
  • X-ray diffraction

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)


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