TY - GEN
T1 - An expert system for industrial machine vision
AU - Kitamura, Yoshifumi
AU - Sato, Hiroaki
AU - Tamura, Hideyuki
PY - 1990/12/1
Y1 - 1990/12/1
N2 - An expert system for algorithm design for industrial machine vision is presented. Its knowledge base includes human experts' knowledge about image processing techniques, and it is capable of solving given vision problems. As a problem domain, the authors have chosen vision algorithms for a parts feeder, which determines the attitude of mechanical parts on a conveyor belt and rejects parts with inappropriate attitudes. The expert system for a parts feeder is designed to consists of three components: a feature selection expert, an image processing expert, and a decision tree generator. The knowledge necessary for the design of a vision algorithm for determining the attitudes of parts is discussed. A framework for representing the knowledge needed in order to find solutions to pattern classification problems is established.
AB - An expert system for algorithm design for industrial machine vision is presented. Its knowledge base includes human experts' knowledge about image processing techniques, and it is capable of solving given vision problems. As a problem domain, the authors have chosen vision algorithms for a parts feeder, which determines the attitude of mechanical parts on a conveyor belt and rejects parts with inappropriate attitudes. The expert system for a parts feeder is designed to consists of three components: a feature selection expert, an image processing expert, and a decision tree generator. The knowledge necessary for the design of a vision algorithm for determining the attitudes of parts is discussed. A framework for representing the knowledge needed in order to find solutions to pattern classification problems is established.
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M3 - Conference contribution
AN - SCOPUS:0025531319
SN - 0818620625
T3 - Proceedings - International Conference on Pattern Recognition
SP - 771
EP - 774
BT - Proceedings - International Conference on Pattern Recognition
PB - Publ by IEEE
T2 - Proceedings of the 10th International Conference on Pattern Recognition
Y2 - 16 June 1990 through 21 June 1990
ER -