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An electron-beam-induced current investigation of electrical defects in high-k gate stacks
J. Chen, T. Sekiguchi, N. Fukata, M. Takase, Y. Nemoto, R. Hasunuma, K. Yamabe, M. Sato, K. Yamada, T. Chikyow
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
1
Citation
(Scopus)