An apparatus for measuring the beam emittance of the Tohoku AVF cyclotron

K. Ishii, M. Fujioka, H. Orihara, T. Shinozuka, K. Sera, S. Morita, M. Maruyama, Y. Tsuji

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

An emittance-measuring system for beams from an AVF (azimuthally varying field) cyclotron was designed, constructed and tested, and has been proved to be very useful for operation and adjustment of the cyclotron. This system, based on the one-slit-multidetector method and controlled by microcomputers, can give an elliptical phase-space contour of a beam within one minute. An example of characteristics of an extracted beam is shown for a set of parameters of the cyclotron for 20 MeV protons.

Original languageEnglish
Pages (from-to)1-6
Number of pages6
JournalNuclear Instruments and Methods
Volume185
Issue number1-3
DOIs
Publication statusPublished - 1981 Jun 15

ASJC Scopus subject areas

  • Medicine(all)

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