An active magnetic probe array for the multiple-point concurrent measurement of electromagnetic emissions

Satoshi Aoyama, Shoji Kawahito, Masahiro Yamaguchi

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

In order to diagnose the EMI (Electromagnetic Interference) problem of ICs, an integrated active magnetic probe array has been developed in SOI (Silicon On Insulator)-CMOS technology. Three aligned differential coils, differential amplifiers, a differential to single-ended converter, an output buffer and bias circuits are all integrated in a single-chip. A measurement result shows that the probe achieves an e-field suppression ratio of 33.6 dB at 50 MHz. Furthermore, a two-dimensional magnetic field distribution map is drawn by the probe array using the 3-point concurrent measurement. The obtained image gains three times higher resolution than that of a single scan under an identical condition.

Original languageEnglish
Pages (from-to)3303-3305
Number of pages3
JournalIEEE Transactions on Magnetics
Volume42
Issue number10
DOIs
Publication statusPublished - 2006 Oct

Keywords

  • Arrays
  • Electromagnetic compatibility
  • Electromagnetic interference
  • Electromagnetic measurements

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'An active magnetic probe array for the multiple-point concurrent measurement of electromagnetic emissions'. Together they form a unique fingerprint.

Cite this