Orientation of MgO underlayer deposited on various Cr80M 20 (M: Cr, Ti, Mn, Mo, W) seed layers and grain diameter (GD) and thermal conductivity K of the Cr80M20 seed layer were investigated for the thermally assisted magnetic recording. Moreover, stacking structure for reducing the orientation of the MgO underlayer and controlling the K of the seed layer was discussed through the results. GD of the Cr 80M20 film was varied from 8.7 (M: Ti) to 10.7nm (M: Mn) and distribution of the MgO (002) orientation deposited on the Cr 80M20 seed layer was varied from 10 (M: Ti) to 4.8°(M: Mn) by changing additional material. And the thermal conductivity of the Cr80M20 film was varied from 10.5 (M: Mn) to 29.1 (Mo) W/mK. These results indicate that K of the Cr80M20 seed layer can be varied throughout a range of approximately 10 to 29W/mK while suppressing full width half maximum for MgO (002) orientations, by using a laminar structure of seed layer consists of K-controlled CrM layer/large-GD CrMn layer.
ASJC Scopus subject areas
- Physics and Astronomy(all)