AHE measurements of very thin films and nanosized dots

N. Kikuchi; R. Murillo; J. C. Lodder

doi:10.1016/j.jmmm.2004.10.052

AHE measurements of very thin films and nanosized dots

N. Kikuchi, R. Murillo, J. C. Lodder

Research output: Contribution to journal › Article › peer-review

8 Citations (Scopus)

Abstract

In this paper we present anomalous Hall effect analysis from very thin Co (0.5 nm) film, Co/Pt multilayers and large areas of nanosized dots as well as from a few magnetic dots having a diameter of 120 nm. The dot array is prepared from Co/Pt multilayer by using laser interference lithography (LIL) while the Hall crosses for measuring a few dots are prepared in combination with focussed ion beam (FIB). The hysteresis loops from a few dots are showing significant Hall voltage jumps corresponding to magnetic response due to an inhomogeneous reversal mechanism because the intensity of the jumps is smaller than the expected value from a total magnetization reversal of one dot.

Original language	English
Pages (from-to)	320-324
Number of pages	5
Journal	Journal of Magnetism and Magnetic Materials
Volume	287
Issue number	SPEC. ISS.
DOIs	https://doi.org/10.1016/j.jmmm.2004.10.052
Publication status	Published - 2005 Feb 1
Externally published	Yes

Keywords

Anomalous Hall effect
Co/Pt multilayer
Patterned media

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

Access to Document

10.1016/j.jmmm.2004.10.052

Fingerprint Dive into the research topics of 'AHE measurements of very thin films and nanosized dots'. Together they form a unique fingerprint.

Cite this

@article{69489c9745bd4b72b2724b94858098dd,

title = "AHE measurements of very thin films and nanosized dots",

abstract = "In this paper we present anomalous Hall effect analysis from very thin Co (0.5 nm) film, Co/Pt multilayers and large areas of nanosized dots as well as from a few magnetic dots having a diameter of 120 nm. The dot array is prepared from Co/Pt multilayer by using laser interference lithography (LIL) while the Hall crosses for measuring a few dots are prepared in combination with focussed ion beam (FIB). The hysteresis loops from a few dots are showing significant Hall voltage jumps corresponding to magnetic response due to an inhomogeneous reversal mechanism because the intensity of the jumps is smaller than the expected value from a total magnetization reversal of one dot.",

keywords = "Anomalous Hall effect, Co/Pt multilayer, Patterned media",

author = "N. Kikuchi and R. Murillo and Lodder, {J. C.}",

year = "2005",

month = feb,

day = "1",

doi = "10.1016/j.jmmm.2004.10.052",

language = "English",

volume = "287",

pages = "320--324",

journal = "Journal of Magnetism and Magnetic Materials",

issn = "0304-8853",

publisher = "Elsevier",

number = "SPEC. ISS.",

}

TY - JOUR

T1 - AHE measurements of very thin films and nanosized dots

AU - Kikuchi, N.

AU - Murillo, R.

AU - Lodder, J. C.

PY - 2005/2/1

Y1 - 2005/2/1

N2 - In this paper we present anomalous Hall effect analysis from very thin Co (0.5 nm) film, Co/Pt multilayers and large areas of nanosized dots as well as from a few magnetic dots having a diameter of 120 nm. The dot array is prepared from Co/Pt multilayer by using laser interference lithography (LIL) while the Hall crosses for measuring a few dots are prepared in combination with focussed ion beam (FIB). The hysteresis loops from a few dots are showing significant Hall voltage jumps corresponding to magnetic response due to an inhomogeneous reversal mechanism because the intensity of the jumps is smaller than the expected value from a total magnetization reversal of one dot.

AB - In this paper we present anomalous Hall effect analysis from very thin Co (0.5 nm) film, Co/Pt multilayers and large areas of nanosized dots as well as from a few magnetic dots having a diameter of 120 nm. The dot array is prepared from Co/Pt multilayer by using laser interference lithography (LIL) while the Hall crosses for measuring a few dots are prepared in combination with focussed ion beam (FIB). The hysteresis loops from a few dots are showing significant Hall voltage jumps corresponding to magnetic response due to an inhomogeneous reversal mechanism because the intensity of the jumps is smaller than the expected value from a total magnetization reversal of one dot.

KW - Anomalous Hall effect

KW - Co/Pt multilayer

KW - Patterned media

UR - http://www.scopus.com/inward/record.url?scp=12344324679&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=12344324679&partnerID=8YFLogxK

U2 - 10.1016/j.jmmm.2004.10.052

DO - 10.1016/j.jmmm.2004.10.052

M3 - Article

AN - SCOPUS:12344324679

VL - 287

SP - 320

EP - 324

JO - Journal of Magnetism and Magnetic Materials

JF - Journal of Magnetism and Magnetic Materials

SN - 0304-8853

IS - SPEC. ISS.

ER -