AFM Characterization of Polymer Nanocomposites

Ken Nakajima, Dong Wang, Toshio Nishi

    Research output: Chapter in Book/Report/Conference proceedingChapter

    8 Citations (Scopus)
    Original languageEnglish
    Title of host publicationCharacterization Techniques for Polymer Nanocomposites
    PublisherWiley-VCH
    Pages185-228
    Number of pages44
    ISBN (Print)9783527331482
    DOIs
    Publication statusPublished - 2012 Aug 24

    Keywords

    • Atomic force microscope (AFM)
    • Cantilever deflection
    • Hooke's law
    • Nanoindenter system
    • Van der Waals force
    • Young's modulus

    ASJC Scopus subject areas

    • Physics and Astronomy(all)
    • Materials Science(all)

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