@inbook{dbc448893e504b6eb06b13a076471150,
title = "AFM Characterization of Polymer Nanocomposites",
keywords = "Atomic force microscope (AFM), Cantilever deflection, Hooke's law, Nanoindenter system, Van der Waals force, Young's modulus",
author = "Ken Nakajima and Dong Wang and Toshio Nishi",
year = "2012",
month = aug,
day = "24",
doi = "10.1002/9783527654505.ch8",
language = "English",
isbn = "9783527331482",
pages = "185--228",
booktitle = "Characterization Techniques for Polymer Nanocomposites",
publisher = "Wiley-VCH",
}