Advanced split-illumination electron holography without Fresnel fringes

Toshiaki Tanigaki; Shinji Aizawa; Hyun Soon Park; Tsuyoshi Matsuda; Ken Harada; Daisuke Shindo

doi:10.1016/j.ultramic.2013.11.002

Advanced split-illumination electron holography without Fresnel fringes

Toshiaki Tanigaki, Shinji Aizawa, Hyun Soon Park, Tsuyoshi Matsuda, Ken Harada, Daisuke Shindo

Center for Advanced Microscopy and Spectroscopy

Research output: Contribution to journal › Article › peer-review

21 Citations (Scopus)

Abstract

Advanced split-illumination electron holography was developed by employing two biprisms in the illuminating system to split an electron wave into two coherent waves and two biprisms in the imaging system to overlap them. A focused image of an upper condenser-biprism filament was formed on the sample plane, and all other filaments were placed in its shadow. This developed system makes it possible to obtain precise reconstructed object waves without modulations due to Fresnel fringes, in addition to holograms of distant objects from reference waves.

Original language	English
Pages (from-to)	7-11
Number of pages	5
Journal	Ultramicroscopy
Volume	137
DOIs	https://doi.org/10.1016/j.ultramic.2013.11.002
Publication status	Published - 2014 Feb

Keywords

Double biprism
Electron holography
Fresnel fringes
Split illumination

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Instrumentation

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@article{8718c9b659304bafaa5ed1e741164221,

title = "Advanced split-illumination electron holography without Fresnel fringes",

abstract = "Advanced split-illumination electron holography was developed by employing two biprisms in the illuminating system to split an electron wave into two coherent waves and two biprisms in the imaging system to overlap them. A focused image of an upper condenser-biprism filament was formed on the sample plane, and all other filaments were placed in its shadow. This developed system makes it possible to obtain precise reconstructed object waves without modulations due to Fresnel fringes, in addition to holograms of distant objects from reference waves.",

keywords = "Double biprism, Electron holography, Fresnel fringes, Split illumination",

author = "Toshiaki Tanigaki and Shinji Aizawa and Park, {Hyun Soon} and Tsuyoshi Matsuda and Ken Harada and Daisuke Shindo",

note = "Funding Information: The authors are grateful to the late Akira Tonomura, who gave us the opportunity to perform this research, for his invaluable discussions. We are also grateful to Kyoichiro Asayama and Naoto Hashikawa of Renesas Electronics Co. for providing nMOS samples and giving their valuable comments as well as to Noboru Moriya of Hitachi Ltd. and Hideki Masuda of Hitachi High-Tech Solutions Co. for their technical support. This research was supported by a grant from the Japan Society for the Promotion of Science (JSPS) through the “Funding Program for World-Leading Innovative R&D on Science and Technology (FIRST Program),” initiated by the Council for Science and Technology Policy (CSTP). ",

year = "2014",

month = feb,

doi = "10.1016/j.ultramic.2013.11.002",

language = "English",

volume = "137",

pages = "7--11",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier",

}

TY - JOUR

T1 - Advanced split-illumination electron holography without Fresnel fringes

AU - Tanigaki, Toshiaki

AU - Aizawa, Shinji

AU - Park, Hyun Soon

AU - Matsuda, Tsuyoshi

AU - Harada, Ken

AU - Shindo, Daisuke

N1 - Funding Information: The authors are grateful to the late Akira Tonomura, who gave us the opportunity to perform this research, for his invaluable discussions. We are also grateful to Kyoichiro Asayama and Naoto Hashikawa of Renesas Electronics Co. for providing nMOS samples and giving their valuable comments as well as to Noboru Moriya of Hitachi Ltd. and Hideki Masuda of Hitachi High-Tech Solutions Co. for their technical support. This research was supported by a grant from the Japan Society for the Promotion of Science (JSPS) through the “Funding Program for World-Leading Innovative R&D on Science and Technology (FIRST Program),” initiated by the Council for Science and Technology Policy (CSTP).

PY - 2014/2

Y1 - 2014/2

N2 - Advanced split-illumination electron holography was developed by employing two biprisms in the illuminating system to split an electron wave into two coherent waves and two biprisms in the imaging system to overlap them. A focused image of an upper condenser-biprism filament was formed on the sample plane, and all other filaments were placed in its shadow. This developed system makes it possible to obtain precise reconstructed object waves without modulations due to Fresnel fringes, in addition to holograms of distant objects from reference waves.

AB - Advanced split-illumination electron holography was developed by employing two biprisms in the illuminating system to split an electron wave into two coherent waves and two biprisms in the imaging system to overlap them. A focused image of an upper condenser-biprism filament was formed on the sample plane, and all other filaments were placed in its shadow. This developed system makes it possible to obtain precise reconstructed object waves without modulations due to Fresnel fringes, in addition to holograms of distant objects from reference waves.

KW - Double biprism

KW - Electron holography

KW - Fresnel fringes

KW - Split illumination

UR - http://www.scopus.com/inward/record.url?scp=84888054456&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84888054456&partnerID=8YFLogxK

U2 - 10.1016/j.ultramic.2013.11.002

DO - 10.1016/j.ultramic.2013.11.002

M3 - Article

AN - SCOPUS:84888054456

VL - 137

SP - 7

EP - 11

JO - Ultramicroscopy

JF - Ultramicroscopy

SN - 0304-3991

ER -