Advanced electron microscopy for materials science

Zentaro Akase, Mitsuaki Higo, Keiko Shimada, Takafumi Sato, Hideyuki Magara, Daisuke Shindo, Nobuhiko Ohno

Research output: Contribution to journalArticlepeer-review

Abstract

This paper presents current research trends in advanced electron microscopy techniques for materials science. The survey is based on the special issue of Materials Transactions published in October 2019 (Vol. 60, No. 10). Advanced electron microscopy has been applied extensively to characterize various materials. The recent development and extension of analyses of electric fields and the collective motions of secondary electrons by in situ electron holography are discussed in detail.

Original languageEnglish
Pages (from-to)1589-1595
Number of pages7
JournalMaterials Transactions
Volume62
Issue number10
DOIs
Publication statusPublished - 2021 Oct 1

Keywords

  • Dynamical diffraction
  • Electric field
  • Electron holography
  • In situ experiment
  • Secondary electron

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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