Accurate error bit mode analysis of STT-MRAM chip with a novel current measurement module implemented to gigabit class memory test system

R. Tamura, I. Mori, N. Watanabe, H. Koike, T. Endoh

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A novel memory test system is needed for future STTMRAM mass production that supports error bit analysis and its mode categorization on STT-MRAM chip measurement, as STTMRAM cell's switching is a probabilistic phenomenon based on quantum mechanics. In order to meet this requirement, we successfully developed a novel current measurement module on gigabit class memory test system that can measure the time domain switching current of each bit with nanosecond and microampere resolution. Moreover, we demonstrated the world's first results that our developed memory test system detects all error bits in fabricated STT-MRAM chip and categorizes error bit mode according to the switching characteristics of each error bit. This novel memory test system with the function of accurate and high speed time domain current measurement on the same level as single bit measurement equipment is expected to accelerate RD and mass production of STT-MRAM and other applications such as ReRAM and PCM.

Original languageEnglish
Title of host publicationNVMTS 2018 - Non-Volatile Memory Technology Symposium 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781538677834
DOIs
Publication statusPublished - 2019 Jan 4
Event18th Non-Volatile Memory Technology Symposium, NVMTS 2018 - Sendai, Japan
Duration: 2018 Oct 222018 Oct 24

Publication series

NameNVMTS 2018 - Non-Volatile Memory Technology Symposium 2018

Conference

Conference18th Non-Volatile Memory Technology Symposium, NVMTS 2018
CountryJapan
CitySendai
Period18/10/2218/10/24

Keywords

  • STT-MRAM
  • error bit analysis
  • error bit mode
  • memory test system
  • switching current;

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

Fingerprint Dive into the research topics of 'Accurate error bit mode analysis of STT-MRAM chip with a novel current measurement module implemented to gigabit class memory test system'. Together they form a unique fingerprint.

Cite this