Accurate circuit performance prediction model and lifetime prediction method of NBT stressed devices for highly reliable ULSI circuits

Rihito Kuroda, Kazufumi Watanabe, Akinobu Teramoto, Michihiko Mifuji, Takahisa Yamaha, Shigetoshi Sugawa, Tadahiro Ohmi

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

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