Accurat time constant of random telegraph signal extracted by a sufficient long time measurement in very large-scale array TEG

T. Fujisawa, K. Abe, S. Watabe, Naoto Miyamoto, Akinobu Teramoto, Shigetoshi Sugawa, T. Ohmi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

11 Citations (Scopus)

Abstract

To suppress Random Telegraph Signal (RTS) noise in MOSFETs, it is necessary to understand the phenomena of RTS. We can extract the accurate time constant in RTS noise by measuring a huge number of MOSFETs during a long time. Time constant is useful to obtain the energy level. In this paper, we demonstrated the statistical and accurate measurement method of the time constant of RTS by a sufficient long measuring in very large-scale array TEG.

Original languageEnglish
Title of host publicationICMTS 2009 - 2009 IEEE International Conference on Microelectronic Test Structures
Pages19-24
Number of pages6
DOIs
Publication statusPublished - 2009 Jul 15
Event2009 IEEE International Conference on Microelectronic Test Structures, ICMTS 2009 - Oxnard, CA, United States
Duration: 2009 Mar 302009 Apr 2

Publication series

NameIEEE International Conference on Microelectronic Test Structures

Other

Other2009 IEEE International Conference on Microelectronic Test Structures, ICMTS 2009
CountryUnited States
CityOxnard, CA
Period09/3/3009/4/2

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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