Ac loss characteristics of hts coated conductors with copper stabilization layers subjected to bending strain

O. Tsukamoto, Z. Li, Y. Kawano, A. Kataoka, D. Miyagi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Influence of copper layers on AC transport current losses in copper stabilized YBCO coated conductors subjected to bending strains was investigated. The bending strains were applied to conductor samples by mounting the samples on sample holders consisted of straight and half-cylindrical sections. The directions of the bending were that the copper layer was subjected to tensile strain (the outward bending) or compressive strain (inward bending). The thickness of the copper layer was 100 μm. Experimental results showed that there is no apparent influence of copper layer on the AC transport loss characteristics. There were dependences of the losses on the bending strains. However, when the loss characteristics are normalized by the strain dependent critical currents, the losses vs. AC transport characteristics dependent on bending strains can be expressed by one curve in both cases of the outward and inward bendings.

Original languageEnglish
Title of host publicationAdvances in Cryogenic Engineering - Transactions of the InternationalCryogenic Materials Conference, ICMC, Vol. 54
Pages487-493
Number of pages7
DOIs
Publication statusPublished - 2008
Event2007 Cryogenic Engineering and International Cryogenic Materials Conferences, CEC-ICMC 2007 - Chattanooga, TN, United States
Duration: 2007 Jul 162007 Jul 20

Publication series

NameAIP Conference Proceedings
Volume986
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Other

Other2007 Cryogenic Engineering and International Cryogenic Materials Conferences, CEC-ICMC 2007
CountryUnited States
CityChattanooga, TN
Period07/7/1607/7/20

Keywords

  • AC loss
  • Coated conductor
  • bending strain
  • copper stabilization
  • transport current

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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