A valence-selective X-ray fluorescence holography study of an yttrium oxide thin film

J. R. Stellhorn, S. Hosokawa, N. Happo, H. Tajiri, T. Matsushita, K. Kaminaga, T. Fukumura, T. Hasegawa, K. Hayashi

Research output: Contribution to journalArticlepeer-review

13 Citations (Scopus)

Abstract

The first direct valence-selective structure determination by X-ray fluorescence holography is reported. The method is applied to investigate an epitaxial thin film of the rare earth monoxide YO, which has recently been synthesized by pulsed laser deposition. The surface of the sample is easily oxidized to Y2O3. In order to separate the structural information connected with the two different valence states of Y, the X-ray fluorescence holography measurements were performed close to the Y K absorption edge. Using the shift of the absorption edge for the different valence states, very different relative contributions of YO and Y2O3 are obtained. Thus, it is possible to distinguish the crystal structures of YO and Y2O3 in the thin-film sample.The first direct valence-selective structure determination by X-ray fluorescence holography is presented. This method uses the fluorescence intensity variation of specific elements close to the K absorption edge. Thereby, the different crystal structures in a mixed Y2+/Y3+ thin film of yttrium oxide are distinguished.

Original languageEnglish
Pages (from-to)1583-1589
Number of pages7
JournalJournal of Applied Crystallography
Volume50
Issue number6
DOIs
Publication statusPublished - 2017 Dec

Keywords

  • X-ray fluorescence holography
  • thin-film analysis
  • valence selectivity
  • yttrium oxide

ASJC Scopus subject areas

  • Biochemistry, Genetics and Molecular Biology(all)

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