A Three-axis Displacement Sensor with Nanometric Resolution

W. Gao, A. Kimura

Research output: Contribution to journalArticlepeer-review

72 Citations (Scopus)

Abstract

Instead of plane mirrors in a conventional Michelson interferometer for measurement of Z-directional displacement, the three-axis displacement sensor described in this paper employs two sinusoidal XY-grid mirrors with identical pitches (10 μm) and amplitudes (60 nm) of X- and Y-directional sine waves as the stationary reference mirror and the moving scale mirror, respectively. The positive and negative first-order diffraction light beams from the two XY-grids superimposing with each other to generate interference signals, from which the displacements of the scale grid along the X-, Y-, and Z-axes can be simultaneously obtained. Experimental results have verified that the sensor has nanometric resolutions in all the three axes.

Original languageEnglish
Pages (from-to)529-532
Number of pages4
JournalCIRP Annals - Manufacturing Technology
Volume56
Issue number1
DOIs
Publication statusPublished - 2007 Jun 15

Keywords

  • Displacement
  • Metrology
  • Sensor

ASJC Scopus subject areas

  • Mechanical Engineering
  • Industrial and Manufacturing Engineering

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