A theory for the image production mechanism of scanning nonlinear dielectric microscopy and its application to the quantitative evaluation of linear and nonlinear dielectric properties of ferroelectric and piezoelectric materials

Yasuo Cho, Koya Ohara, Satoshi Kazuta, Hiroyuki Odagawa

Research output: Contribution to conferencePaper

Abstract

A theory for scanning nonlinear dielectric microscopy (SNDM) and its application to the quantitative evaluation of the linear and nonlinear dielectric constants of dielectric materials are described. First, a general theorem for the capacitance variation under an applied electric field is derived and a capacitance variation susceptibility Snl, which is a very useful parameter for the quantitative measurement of nonlinear dielectric constants, is defined. This Snl is independent of the tip radius, and therefore the sensitivity of the SNDM probe does not change, even if a tip with a smaller radius is selected to obtain a finer resolution. Using the theoretical results and the data taken by SNDM, the quantitative linear and nonlinear dielectric properties of several dielectric materials were successfully determined. From the calculation of a one-dimensional image of a 180° c-c domain boundary, it is demonstrated that the SNDM has an atomic scale resolution.

Original languageEnglish
Pages991-994
Number of pages4
Publication statusPublished - 2000 Dec 1
Event12th IEEE International Symposium on Applications of Ferroelectrics - Honolulu, HI, United States
Duration: 2000 Jul 212000 Aug 2

Other

Other12th IEEE International Symposium on Applications of Ferroelectrics
CountryUnited States
CityHonolulu, HI
Period00/7/2100/8/2

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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    Cho, Y., Ohara, K., Kazuta, S., & Odagawa, H. (2000). A theory for the image production mechanism of scanning nonlinear dielectric microscopy and its application to the quantitative evaluation of linear and nonlinear dielectric properties of ferroelectric and piezoelectric materials. 991-994. Paper presented at 12th IEEE International Symposium on Applications of Ferroelectrics, Honolulu, HI, United States.