A Study on Relationship between Recording Pattern and Decoding Reliability in SMR

R. Suzutou, Y. Nakamura, M. Nishikawa, H. Osawa, Y. Okamoto, Y. Kanai, H. Muraoka

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

The shingled magnetic recording (SMR) system is influenced by not only jitter-like medium noise from adjacent bits in the down-track direction but also intertrack interference (ITI) from the adjacent tracks. In this paper, we investigate the relationship between the recording pattern and the decoding reliability by classifying the log-likelihood ratio at the a posteriori probability decoder output according to the recording patterns under an SMR R-W channel specification of 4 Tb/in2 by computer simulation. The result shows that the decoding reliability for the recording pattern '010' heavily affected by transition jitter is the lowest and little improved even if the influence of ITI is mitigated by a 2-D finite-impulse response filter.

Original languageEnglish
Article number7962176
JournalIEEE Transactions on Magnetics
Volume53
Issue number11
DOIs
Publication statusPublished - 2017 Nov

Keywords

  • Decoding reliability
  • shingled magnetic recording (SMR)
  • two-dimensional magnetic recording (TDMR)

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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