A study of high-frequency characteristics of write heads with the ac-phase high-frequency magnetic force microscope

Masayuki Abe; Yoichiro Tanaka

doi:10.1109/TMAG.2002.988909

A study of high-frequency characteristics of write heads with the ac-phase high-frequency magnetic force microscope

Masayuki Abe, Yoichiro Tanaka

Research output: Contribution to journal › Article › peer-review

31 Citations (Scopus)

Abstract

We demonstrate frequency characteristic measurement methods of write head with an ac-phase high-frequency magnetic force microscope (HF-MFM). Two measurement methods allow separating the characteristics into electric ones including the head amplifier and/or interconnects and magnetic ones including head materials. The high spatial resolution ac-phase HF-MFM allows resolving the distribution change of the HF magnetic field with frequency. The relation between HF-MFM and spin-stand data was also investigated. It is thought that HF-MFM measurements can be applied to head performance test before HDD manufacturing.

Original language	English
Pages (from-to)	45-49
Number of pages	5
Journal	IEEE Transactions on Magnetics
Volume	38
Issue number	1 I
DOIs	https://doi.org/10.1109/TMAG.2002.988909
Publication status	Published - 2002 Jan 1
Externally published	Yes

Keywords

Frequency characteristics
High-frequency measurement
Magnetic force microscope
Overwrite
Write head

ASJC Scopus subject areas

Electrical and Electronic Engineering
Physics and Astronomy (miscellaneous)

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10.1109/TMAG.2002.988909

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AB - We demonstrate frequency characteristic measurement methods of write head with an ac-phase high-frequency magnetic force microscope (HF-MFM). Two measurement methods allow separating the characteristics into electric ones including the head amplifier and/or interconnects and magnetic ones including head materials. The high spatial resolution ac-phase HF-MFM allows resolving the distribution change of the HF magnetic field with frequency. The relation between HF-MFM and spin-stand data was also investigated. It is thought that HF-MFM measurements can be applied to head performance test before HDD manufacturing.

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