Abstract
We demonstrate frequency characteristic measurement methods of write head with an ac-phase high-frequency magnetic force microscope (HF-MFM). Two measurement methods allow separating the characteristics into electric ones including the head amplifier and/or interconnects and magnetic ones including head materials. The high spatial resolution ac-phase HF-MFM allows resolving the distribution change of the HF magnetic field with frequency. The relation between HF-MFM and spin-stand data was also investigated. It is thought that HF-MFM measurements can be applied to head performance test before HDD manufacturing.
| Original language | English |
|---|---|
| Pages (from-to) | 45-49 |
| Number of pages | 5 |
| Journal | IEEE Transactions on Magnetics |
| Volume | 38 |
| Issue number | 1 I |
| DOIs | |
| Publication status | Published - 2002 Jan |
| Externally published | Yes |
Keywords
- Frequency characteristics
- High-frequency measurement
- Magnetic force microscope
- Overwrite
- Write head
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering