A study of high-frequency characteristics of write heads with the ac-phase high-frequency magnetic force microscope

Masayuki Abe, Yoichiro Tanaka

Research output: Contribution to journalArticlepeer-review

31 Citations (Scopus)

Abstract

We demonstrate frequency characteristic measurement methods of write head with an ac-phase high-frequency magnetic force microscope (HF-MFM). Two measurement methods allow separating the characteristics into electric ones including the head amplifier and/or interconnects and magnetic ones including head materials. The high spatial resolution ac-phase HF-MFM allows resolving the distribution change of the HF magnetic field with frequency. The relation between HF-MFM and spin-stand data was also investigated. It is thought that HF-MFM measurements can be applied to head performance test before HDD manufacturing.

Original languageEnglish
Pages (from-to)45-49
Number of pages5
JournalIEEE Transactions on Magnetics
Volume38
Issue number1 I
DOIs
Publication statusPublished - 2002 Jan 1
Externally publishedYes

Keywords

  • Frequency characteristics
  • High-frequency measurement
  • Magnetic force microscope
  • Overwrite
  • Write head

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Physics and Astronomy (miscellaneous)

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