TY - JOUR
T1 - A study of defects in electron- and ion-irradiated ZrCuAl bulk glassy alloy using positron annihilation techniques
AU - Hori, F.
AU - Onodera, N.
AU - Fukumoto, Y.
AU - Ishii, A.
AU - Iwase, A.
AU - Kawasuso, A.
AU - Yabuuchi, A.
AU - Maekawa, M.
AU - Yokoyama, Y.
PY - 2011
Y1 - 2011
N2 - Free volume changes in Zr50Cu40Al10 bulk glassy alloys irradiated by 200 and 2.5 MeV Xe ions, 180 keV He ions, and 2 MeV electrons were investigated at room temperature using positron annihilation lifetime and Doppler broadening techniques. In addition, a slow positron beam was used to probe the change in free volume in the 180 keV He ion-irradiated sample. X-ray diffraction revealed that no crystallization took place in any of the irradiated samples. The Doppler broadening spectra from the annihilated gamma rays remained essentially constant in all ion-irradiation cases; however, an extremely minor change of positron mean lifetime was detected in each case. For electron- and He ion-irradiated samples the positron lifetime increased, and the opposite was seen in heavy-ion irradiated samples. The Doppler broadening S parameter increased with He-ion radiation dose, and the depth profile correlated well to the damage profile.
AB - Free volume changes in Zr50Cu40Al10 bulk glassy alloys irradiated by 200 and 2.5 MeV Xe ions, 180 keV He ions, and 2 MeV electrons were investigated at room temperature using positron annihilation lifetime and Doppler broadening techniques. In addition, a slow positron beam was used to probe the change in free volume in the 180 keV He ion-irradiated sample. X-ray diffraction revealed that no crystallization took place in any of the irradiated samples. The Doppler broadening spectra from the annihilated gamma rays remained essentially constant in all ion-irradiation cases; however, an extremely minor change of positron mean lifetime was detected in each case. For electron- and He ion-irradiated samples the positron lifetime increased, and the opposite was seen in heavy-ion irradiated samples. The Doppler broadening S parameter increased with He-ion radiation dose, and the depth profile correlated well to the damage profile.
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U2 - 10.1088/1742-6596/262/1/012025
DO - 10.1088/1742-6596/262/1/012025
M3 - Article
AN - SCOPUS:79952155985
SN - 1742-6588
VL - 262
JO - Journal of Physics: Conference Series
JF - Journal of Physics: Conference Series
IS - 1
M1 - 012025
ER -