A simple test structure for evaluating the variability in key characteristics of a large number of MOSFETs

Shunichi Watabe, Akinobu Teramoto, Kenichi Abe, Takafumi Fujisawa, Naoto Miyamoto, Shigetoshi Sugawa, Tadahiro Ohmi

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

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Physics & Astronomy

Engineering & Materials Science

Chemical Compounds