A simple method for removing overlapped Auger signals from ELS or low energy reflection mode EXELFS

Hideyuki Matsuta, Kichinosuke Hirokawa

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

Two simple techniques are described for eliminating overlapped intense Auger signals from electron energy loss spectrum. One is performed by superimposing a small oscillation on both the sample and the CMA band pass energy and detecting only signals which are not altered by the modulation, the other is performed by applying large bias voltage to the sample. These techniques can be used to extract the low energy reflection mode extended electron energy loss fine structure (EXELFS) signals.

Original languageEnglish
Pages (from-to)122-128
Number of pages7
JournalSurface and Interface Analysis
Volume7
Issue number3
DOIs
Publication statusPublished - 1985 Jun

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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