A simple hard x-ray "nanoslit" for measuring wavefront intensity

Hidekazu Takano, Takuto Hashimoto, Takuya Tsuji, Takahisa Koyama, Yoshiyuki Tsusaka, Yasushi Kagoshima

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

A new method is proposed for nanoscale hard x-ray measurements. This method uses a reflection on a heavy-metal wire that functions as a single slit with a nanoscale aperture for a parallel x-ray beam. This "nanoslit" can be used to perform high-spatial-resolution measurements of the intensity distribution of a wavefront that diverges from an aperture. In experiments, Fresnel fringes generated by a rectangular aperture were measured using a 300-μm -diameter platinum wire as the nanoslit. In these experiments, the finest fringes with a period of 26 nm could be successfully resolved.

Original languageEnglish
Article number073702
JournalReview of Scientific Instruments
Volume81
Issue number7
DOIs
Publication statusPublished - 2010 Jul
Externally publishedYes

ASJC Scopus subject areas

  • Instrumentation

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