A simple accurate method of alignment of beamline optics with the use of EUV multilayer polarizers

Masaki Yamamoto, Minaji Furudate, Mihiro Yanagihara, Hiroaki Kimura

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

A simple alignment method is proposed, which enables the alignment of beamline optics of a bending section accurately, relying on the linear state of polarization of synchrotron orbital radiation rather than the beam intensity. The method utilizes extreme UV (EUV) multilayers as a compact polarization monitor detecting unwanted vertical polarization components. The proposed method was found to be far more sensitive than that relying on the maximum intensity. Another advantage is the insensitivity to surface contamination, such as an irradiation mark on the mirror degrading reflectance. A design example is presented for use around a photon energy of 370 eV along with an experimental example at a photon energy of 97 eV.

Original languageEnglish
Pages (from-to)696-698
Number of pages3
JournalJournal of Synchrotron Radiation
Volume5
Issue number3
DOIs
Publication statusPublished - 1998 May 1

Keywords

  • Extreme UV (EUV)
  • Multilayer mirror
  • Polarization monitor
  • Polarizer

ASJC Scopus subject areas

  • Radiation
  • Nuclear and High Energy Physics
  • Instrumentation

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