TY - GEN
T1 - A scanning-light method for inspection of tool cutting edge
AU - Shimizu, Yuki
AU - Jang, Sungho
AU - Asai, Takemi
AU - Ito, So
AU - Ko, I
PY - 2012/7/30
Y1 - 2012/7/30
N2 - In this paper, a scanning-light method is proposed to evaluate the form of the tool cutting edge in a wide range up to several millimeters. An optical system, which consists of a photo diode, a laser diode unit and an objective lens, was developed. A small laser spot generated by the objective lens scans across the tool cutting edge, while monitoring the intensity of the laser beam passed through the tool cutting edge. In the proposed method, variation of the detected intensity is converted into information of the measured tool form. Feasibility of the proposed method was confirmed by simulations and experiments.
AB - In this paper, a scanning-light method is proposed to evaluate the form of the tool cutting edge in a wide range up to several millimeters. An optical system, which consists of a photo diode, a laser diode unit and an objective lens, was developed. A small laser spot generated by the objective lens scans across the tool cutting edge, while monitoring the intensity of the laser beam passed through the tool cutting edge. In the proposed method, variation of the detected intensity is converted into information of the measured tool form. Feasibility of the proposed method was confirmed by simulations and experiments.
KW - cutting tool
KW - focused laser beam
KW - measurement
KW - micro-object
KW - optical sensor
KW - positioning
UR - http://www.scopus.com/inward/record.url?scp=84864199362&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84864199362&partnerID=8YFLogxK
U2 - 10.1109/I2MTC.2012.6229215
DO - 10.1109/I2MTC.2012.6229215
M3 - Conference contribution
AN - SCOPUS:84864199362
SN - 9781457717710
T3 - 2012 IEEE I2MTC - International Instrumentation and Measurement Technology Conference, Proceedings
SP - 2395
EP - 2397
BT - 2012 IEEE I2MTC - International Instrumentation and Measurement Technology Conference, Proceedings
T2 - 2012 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2012
Y2 - 13 May 2012 through 16 May 2012
ER -