A scale estimation algorithm using phase-based correspondence matching for electron microscope images

Ayako Suzuki, Koichi Ito, Takafumi Aoki, Ruriko Tsuneta

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper proposes a multi-stage scale estimation algorithm using phase-based correspondence matching for electron microscope images. Consider a sequence of microscope images of the same target object, where the image magnification is gradually increased so that the final image has a very large scale factor S (e.g., S = 1, 000) with respect to the initial image. The problem considered in this paper is to estimate the overall scale factor S of the given image sequence. The proposed scale estimation technique provides a new methodology for high-accuracy magnification calibration of electron microscopes. Experimental evaluation using Mandelbrot images as precisely scale-controlled image sequence shows that the proposed method can estimate the scale factor S = 1, 000 with approximately 0.1%-scale error. This paper also describes an application of the proposed algorithm to the magnification calibration of an actual STEM (Scanning Transmission Electron Microscope).

Original languageEnglish
Title of host publicationProceedings - 2010 20th International Conference on Pattern Recognition, ICPR 2010
Pages2420-2423
Number of pages4
DOIs
Publication statusPublished - 2010 Nov 18
Event2010 20th International Conference on Pattern Recognition, ICPR 2010 - Istanbul, Turkey
Duration: 2010 Aug 232010 Aug 26

Other

Other2010 20th International Conference on Pattern Recognition, ICPR 2010
CountryTurkey
CityIstanbul
Period10/8/2310/8/26

Keywords

  • Correspondence matching
  • Electron microscope
  • Image matching
  • Phase-only correlation
  • Scale estimation

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition

Fingerprint Dive into the research topics of 'A scale estimation algorithm using phase-based correspondence matching for electron microscope images'. Together they form a unique fingerprint.

  • Cite this

    Suzuki, A., Ito, K., Aoki, T., & Tsuneta, R. (2010). A scale estimation algorithm using phase-based correspondence matching for electron microscope images. In Proceedings - 2010 20th International Conference on Pattern Recognition, ICPR 2010 (pp. 2420-2423). [5595746] https://doi.org/10.1109/ICPR.2010.592