A delay-error compensation technique is described using time domain reflectometry (TDR) for timing calibration of several-hundred-MHz testers. A ramp approximation model is proposed to precisely and simply estimate actual propagation delay times along tester-DUT interfaces. The model is studied by using a newly developed time interval counter module. The experimental results demonstrate that the delay error in TDR can be compensated for within ±3 ps. The transmission line model could precisely represent the waveform deterioration caused by capacitive elements and in dependence on the input signal slew rate.
|Number of pages||7|
|Journal||Digest of Papers - International Test Conference|
|Publication status||Published - 1992 Jan 1|
|Event||Proceedings of the International Test Conference 1991 - Nashville, TN, USA|
Duration: 1991 Oct 26 → 1991 Oct 30
ASJC Scopus subject areas