A novel sample preparation method on CeO2 nanoparticles with TEM grid embedded liquid CO2 displacement and supercritical CO2 drying for microscopic analysis

Won Su Son, Tae Jun Yoon, Hee Jeong Park, Minsoo Kim, Tadafumi Adschiri, Youn Woo Lee

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

The structural information of nanomaterials obtained from the microscopy is essential to interpret the crystal morphology, growth, and reaction kinetics. Transmission electron microscopy (TEM) is one of the most popular tools for the characterization of nanomaterials. This study reveals that conventional preparation methods for the TEM analysis largely influence the morphology and size of the synthesized nanoparticles even when they are cautiously controlled. A rigorous image analysis on the TEM images in conjunction with the selected area electron diffraction analysis of the pherical aberration corrected TEM images substantiates that small non-faceted particles grow on the large faceted particles during the conventional sample preparation for microscopic analysis. This result shows that a proper sample preparation method must be used to observe the nanomaterial as synthesized. We propose a preparation method to preserve the morphology and size of the synthesized nanoparticles by TEM grid embedded liquid CO2 displacement followed by supercritical drying.

Original languageEnglish
Article number104559
JournalJournal of Supercritical Fluids
Volume152
DOIs
Publication statusPublished - 2019 Oct

Keywords

  • Cerium oxide nanoparticles
  • Evaporative drying
  • Liquid CO displacement
  • Particle size distribution
  • Supercritical drying
  • TEM sample preparation

ASJC Scopus subject areas

  • Chemical Engineering(all)
  • Condensed Matter Physics
  • Physical and Theoretical Chemistry

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