A novel probe of intrinsic electronic structure: Hard X-ray photoemission spectroscopy

Y. Takata, K. Tamasaku, Y. Nishino, D. Miwa, M. Yabashi, E. Ikenaga, K. Horiba, M. Arita, K. Shimada, H. Namatame, H. Nohira, T. Hattori, S. Södergren, B. Wannberg, M. Taniguchi, S. Shin, T. Ishikawa, K. Kobayashi

    Research output: Contribution to journalArticlepeer-review

    11 Citations (Scopus)


    We have realized hard X-ray (HX) photoemission spectroscopy (PES) with high throughput and high-energy resolution for core level and valence band studies using high-energy and high-brilliance synchrotron radiation at SPring-8. This is a brand new method because large escape depth of high-energy photoelectrons enables us to probe intrinsic bulk states free from surface condition. By use of a newly developed electron energy analyzer and well-focused X-rays, high-energy resolution of 75 meV (E/ΔE = 79,000) was realized for 5.95 keV photoelectrons.

    Original languageEnglish
    Pages (from-to)1063-1065
    Number of pages3
    JournalJournal of Electron Spectroscopy and Related Phenomena
    Publication statusPublished - 2005 Jun


    • Bulk probe
    • Electronic structure
    • Photoemission spectroscopy

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Radiation
    • Atomic and Molecular Physics, and Optics
    • Condensed Matter Physics
    • Spectroscopy
    • Physical and Theoretical Chemistry


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