A novel portable material characterization system using AC magnetization probe

H. Endo; M. Shiwa; T. Abe; T. Uchimoto; T. Takagi

A novel portable material characterization system using AC magnetization probe

H. Endo, M. Shiwa, T. Abe, T. Uchimoto, T. Takagi

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	INTERMAG ASIA 2005
Subtitle of host publication	Digests of the IEEE International Magnetics Conference
Pages	582
Number of pages	1
Publication status	Published - 2005
Event	INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference - Nagoya, Japan Duration: 2005 Apr 4 → 2005 Apr 8

Publication series

Name	INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference

Other

Other	INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference
Country	Japan
City	Nagoya
Period	05/4/4 → 05/4/8

ASJC Scopus subject areas

Engineering(all)

Cite this

A novel portable material characterization system using AC magnetization probe. / Endo, H.; Shiwa, M.; Abe, T.; Uchimoto, T.; Takagi, T.

INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference. 2005. p. 582 (INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Endo, H, Shiwa, M, Abe, T, Uchimoto, T & Takagi, T 2005, A novel portable material characterization system using AC magnetization probe. in INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference. INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference, pp. 582, INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference, Nagoya, Japan, 05/4/4.

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year = "2005",

language = "English",

isbn = "0780390091",

series = "INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference",

pages = "582",

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TY - GEN

T1 - A novel portable material characterization system using AC magnetization probe

AU - Endo, H.

AU - Shiwa, M.

AU - Abe, T.

AU - Uchimoto, T.

AU - Takagi, T.

PY - 2005

Y1 - 2005

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M3 - Conference contribution

AN - SCOPUS:28444482809

SN - 0780390091

T3 - INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference

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BT - INTERMAG ASIA 2005

T2 - INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference

Y2 - 4 April 2005 through 8 April 2005

ER -

A novel portable material characterization system using AC magnetization probe

Publication series

Other

ASJC Scopus subject areas

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