A novel portable material characterization system using AC magnetization probe

H. Endo; M. Shiwa; T. Abe; T. Uchimoto; T. Takagi

A novel portable material characterization system using AC magnetization probe

H. Endo, M. Shiwa, T. Abe, T. Uchimoto, T. Takagi

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	INTERMAG ASIA 2005
Subtitle of host publication	Digests of the IEEE International Magnetics Conference
Pages	582
Number of pages	1
Publication status	Published - 2005
Event	INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference - Nagoya, Japan Duration: 2005 Apr 4 → 2005 Apr 8

Publication series

Name	INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference

Other

Other	INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference
Country	Japan
City	Nagoya
Period	05/4/4 → 05/4/8

ASJC Scopus subject areas

Engineering(all)

Access to Document

Cite this

Endo, H., Shiwa, M., Abe, T., Uchimoto, T., & Takagi, T. (2005). A novel portable material characterization system using AC magnetization probe. In INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference (pp. 582). (INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference).

A novel portable material characterization system using AC magnetization probe. / Endo, H.; Shiwa, M.; Abe, T.; Uchimoto, T.; Takagi, T.

INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference. 2005. p. 582 (INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Endo, H, Shiwa, M, Abe, T, Uchimoto, T & Takagi, T 2005, A novel portable material characterization system using AC magnetization probe. in INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference. INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference, pp. 582, INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference, Nagoya, Japan, 05/4/4.

@inproceedings{618a14d33e664e1ba5abfabf932c1f39,

title = "A novel portable material characterization system using AC magnetization probe",

author = "H. Endo and M. Shiwa and T. Abe and T. Uchimoto and T. Takagi",

year = "2005",

language = "English",

isbn = "0780390091",

series = "INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference",

pages = "582",

booktitle = "INTERMAG ASIA 2005",

note = "INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference ; Conference date: 04-04-2005 Through 08-04-2005",

}

TY - GEN

T1 - A novel portable material characterization system using AC magnetization probe

AU - Endo, H.

AU - Shiwa, M.

AU - Abe, T.

AU - Uchimoto, T.

AU - Takagi, T.

PY - 2005

Y1 - 2005

UR - http://www.scopus.com/inward/record.url?scp=28444482809&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=28444482809&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:28444482809

SN - 0780390091

T3 - INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference

SP - 582

BT - INTERMAG ASIA 2005

T2 - INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference

Y2 - 4 April 2005 through 8 April 2005

ER -