A novel estimation method of dielectric permittivity by using scattered waves

Takashi Komakine, Takahiro Kurosawa, Kazuaki Miyanaga, Hiroshi Inoue

Research output: Contribution to journalArticlepeer-review

Abstract

The dielectric is one of important materials in electric devices. To evaluate the permittivity of the material in high radio frequency range, several practical measurement systems have been developed. The scattered method proposed in this paper can easily estimate the permittivity of a dielectric whose size can be small in comparison to the wavelength. The relationship between the scattered field strength and the permittivity of the dielectric scatterer is theoretically analyzed, and the formulation is denoted quantitatively. Additionally, the polarizability of a cube and a cylinder was investigated to compensate for the effects shape of the specimen might have. Their compensation factors to the value of a spherical were calculated to be less than 30 % larger. Moreover, a frequency domain method detecting the phase shift of the scattered wave caused by the polarization delay was studied to estimate dielectric loss.

Original languageEnglish
Pages (from-to)277-282+8
JournalIEEJ Transactions on Fundamentals and Materials
Volume131
Issue number4
DOIs
Publication statusPublished - 2011 Sep 12

Keywords

  • Dielectric loss
  • Dielectric permittivity
  • Modulated scattering technique
  • Scattered wave

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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