A new insight into the dynamic fluctuation mechanism of stress-induced leakage current

T. Ishida, N. Tega, Y. Mori, H. Miki, T. Mine, H. Kume, K. Torii, M. Muraguchi, Y. Takada, K. Shiraishi, R. Yamada

Research output: Chapter in Book/Report/Conference proceedingConference contribution

16 Citations (Scopus)

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Engineering & Materials Science