A new enrichment scheme for the interfacial crack modeling using the XFEM

Huachao Deng, Bo Yan, Xiaomin Zhang, Yongqiang Zhu

Research output: Contribution to journalArticlepeer-review


A new enrichment scheme is proposed for the interfacial crack modeling in the framework of extended finite element method (XFEM), in which the approximation of displacement in the element including the crack tip is reconstructed by only the Heaviside function and the material interface enrichment function. The proposed enrichment scheme can model not only the discontinuity of displacement across the crack surface but also the discontinuity of displacement gradient across the material interface in the crack tip element with the weight functions. In addition, no blending elements are introduced and it is unnecessary to define the ramp function in the new XFEM formulation. The static and dynamic stress intensity factors (SIFs) of interfacial cracks are analyzed by the new enrichment scheme and the results show that the effect of material interface in the crack tip element plays a significant role in the accuracy of fracture mechanics parameters and the proposed method can predict the deformation more accurately and obtain a more stable dynamic SIFs. The proposed new enrichment scheme can be extended to three dimensional crack modeling in future works.

Original languageEnglish
Article number103595
JournalTheoretical and Applied Fracture Mechanics
Publication statusPublished - 2022 Dec


  • Dynamic interfacial crack propagation
  • Interfacial crack enrichment
  • SIFs of interfacial crack
  • XFEM

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanical Engineering
  • Applied Mathematics


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