@inproceedings{6e5a02e343804d96bac920d4375ca9b7,
title = "A new attachment of the large Debye-Scherrer camera at BL02B2 of the SPring-8 for thin film X-ray diffraction",
abstract = "We have developed a new attachment for thin film x-ray measurements equipped with the large Debye-Scherrer camera at BL02B2 of the SPring-8. It is quite easy to handle and control the attachment using user-friendly computer programs. It is also notable that the attachment realizes both low-glancing-angle incident beam condition and in-plane measurement condition. The attachment enables us to measure high precision x-ray diffraction data from many kinds of thin films with the Debye-Scherrer camera. Using this attachment we try to analyze some dimensionally controlled thin film structures.",
keywords = "Debye-Scherrer camera, In-plane diffraction, Nanomaterials, Thin film",
author = "Keiichi Osaka and Shigeru Kimura and Kenichi Kato and Masaki Takata",
year = "2007",
doi = "10.1063/1.2436412",
language = "English",
isbn = "0735403732",
series = "AIP Conference Proceedings",
pages = "1771--1774",
booktitle = "SYNCHROTRON RADIATION INSTRUMENTATION",
note = "SYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation ; Conference date: 28-05-2006 Through 28-06-2006",
}