A new attachment of the large Debye-Scherrer camera at BL02B2 of the SPring-8 for thin film X-ray diffraction

Keiichi Osaka, Shigeru Kimura, Kenichi Kato, Masaki Takata

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

We have developed a new attachment for thin film x-ray measurements equipped with the large Debye-Scherrer camera at BL02B2 of the SPring-8. It is quite easy to handle and control the attachment using user-friendly computer programs. It is also notable that the attachment realizes both low-glancing-angle incident beam condition and in-plane measurement condition. The attachment enables us to measure high precision x-ray diffraction data from many kinds of thin films with the Debye-Scherrer camera. Using this attachment we try to analyze some dimensionally controlled thin film structures.

Original languageEnglish
Title of host publicationSYNCHROTRON RADIATION INSTRUMENTATION
Subtitle of host publicationNinth International Conference on Synchrotron Radiation Instrumentation
Pages1771-1774
Number of pages4
DOIs
Publication statusPublished - 2007
Externally publishedYes
EventSYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation - Daegu, Korea, Republic of
Duration: 2006 May 282006 Jun 28

Publication series

NameAIP Conference Proceedings
Volume879
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Other

OtherSYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation
Country/TerritoryKorea, Republic of
CityDaegu
Period06/5/2806/6/28

Keywords

  • Debye-Scherrer camera
  • In-plane diffraction
  • Nanomaterials
  • Thin film

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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