A new 200 kV Ω-filter electron microscope

M. Tanaka, K. Tsuda, M. Terauchi, K. Tsuno, T. Kaneyama, T. Honda, M. Ishida

Research output: Contribution to journalArticlepeer-review

37 Citations (Scopus)

Abstract

A new 200kV Ω-filter electron microscope was developed under a project supported by a Grant-in-Aid for Specially Promoted Research of the Ministry of Education. Science, Sports and Culture of Japan. The performance of the microscope is described.

Original languageEnglish
Pages (from-to)219-227
Number of pages9
JournalJournal of Microscopy
Volume194
Issue number1
DOIs
Publication statusPublished - 1999

Keywords

  • CBED
  • Electron microscope
  • Omega filter
  • Structure refinement

ASJC Scopus subject areas

  • Pathology and Forensic Medicine
  • Histology

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