A microscope system for characterization of mechanical properties of small-scaled objects

Hironori Tohmyoh; M. A.S. Akanda; Masumi Saka

doi:10.1109/ESTC.2010.5642853

A microscope system for characterization of mechanical properties of small-scaled objects

Hironori Tohmyoh, M. A.S. Akanda, Masumi Saka

ENG - Finemechanics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

A new microscopy system for characterization of mechanical properties of small-scaled objects is reported. A force sensor, piezo stage, manual manipulators, etc. are integrated in a single platform and these are combined with a high-resolution digital microscope to acquire the load-displacement relationships of the small-scaled objects together with the corresponding deformation pattern of the objects during testing. A small-span bending test of ultrathin Pt wire is demonstrated and the results are discussed.

Original language	English
Title of host publication	Electronics System Integration Technology Conference, ESTC 2010 - Proceedings
DOIs	https://doi.org/10.1109/ESTC.2010.5642853
Publication status	Published - 2010 Dec 1
Event	3rd Electronics System Integration Technology Conference, ESTC 2010 - Berlin, Germany Duration: 2010 Sep 13 → 2010 Sep 16

Publication series

Name	Electronics System Integration Technology Conference, ESTC 2010 - Proceedings

Other

Other	3rd Electronics System Integration Technology Conference, ESTC 2010
Country	Germany
City	Berlin
Period	10/9/13 → 10/9/16

ASJC Scopus subject areas

Control and Systems Engineering
Electrical and Electronic Engineering

Access to Document

10.1109/ESTC.2010.5642853

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A microscope system for characterization of mechanical properties of small-scaled objects. / Tohmyoh, Hironori; Akanda, M. A.S.; Saka, Masumi.

Electronics System Integration Technology Conference, ESTC 2010 - Proceedings. 2010. 5642853 (Electronics System Integration Technology Conference, ESTC 2010 - Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Tohmyoh, H, Akanda, MAS & Saka, M 2010, A microscope system for characterization of mechanical properties of small-scaled objects. in Electronics System Integration Technology Conference, ESTC 2010 - Proceedings., 5642853, Electronics System Integration Technology Conference, ESTC 2010 - Proceedings, 3rd Electronics System Integration Technology Conference, ESTC 2010, Berlin, Germany, 10/9/13. https://doi.org/10.1109/ESTC.2010.5642853

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