TY - GEN
T1 - A microscope system for characterization of mechanical properties of small-scaled objects
AU - Tohmyoh, Hironori
AU - Akanda, M. A.S.
AU - Saka, Masumi
PY - 2010/12/1
Y1 - 2010/12/1
N2 - A new microscopy system for characterization of mechanical properties of small-scaled objects is reported. A force sensor, piezo stage, manual manipulators, etc. are integrated in a single platform and these are combined with a high-resolution digital microscope to acquire the load-displacement relationships of the small-scaled objects together with the corresponding deformation pattern of the objects during testing. A small-span bending test of ultrathin Pt wire is demonstrated and the results are discussed.
AB - A new microscopy system for characterization of mechanical properties of small-scaled objects is reported. A force sensor, piezo stage, manual manipulators, etc. are integrated in a single platform and these are combined with a high-resolution digital microscope to acquire the load-displacement relationships of the small-scaled objects together with the corresponding deformation pattern of the objects during testing. A small-span bending test of ultrathin Pt wire is demonstrated and the results are discussed.
UR - http://www.scopus.com/inward/record.url?scp=78651328411&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=78651328411&partnerID=8YFLogxK
U2 - 10.1109/ESTC.2010.5642853
DO - 10.1109/ESTC.2010.5642853
M3 - Conference contribution
AN - SCOPUS:78651328411
SN - 9781424485536
T3 - Electronics System Integration Technology Conference, ESTC 2010 - Proceedings
BT - Electronics System Integration Technology Conference, ESTC 2010 - Proceedings
T2 - 3rd Electronics System Integration Technology Conference, ESTC 2010
Y2 - 13 September 2010 through 16 September 2010
ER -