A microscope system for characterization of mechanical properties of small-scaled objects

Hironori Tohmyoh, M. A.S. Akanda, Masumi Saka

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A new microscopy system for characterization of mechanical properties of small-scaled objects is reported. A force sensor, piezo stage, manual manipulators, etc. are integrated in a single platform and these are combined with a high-resolution digital microscope to acquire the load-displacement relationships of the small-scaled objects together with the corresponding deformation pattern of the objects during testing. A small-span bending test of ultrathin Pt wire is demonstrated and the results are discussed.

Original languageEnglish
Title of host publicationElectronics System Integration Technology Conference, ESTC 2010 - Proceedings
DOIs
Publication statusPublished - 2010 Dec 1
Event3rd Electronics System Integration Technology Conference, ESTC 2010 - Berlin, Germany
Duration: 2010 Sep 132010 Sep 16

Publication series

NameElectronics System Integration Technology Conference, ESTC 2010 - Proceedings

Other

Other3rd Electronics System Integration Technology Conference, ESTC 2010
CountryGermany
CityBerlin
Period10/9/1310/9/16

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Electrical and Electronic Engineering

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  • Cite this

    Tohmyoh, H., Akanda, M. A. S., & Saka, M. (2010). A microscope system for characterization of mechanical properties of small-scaled objects. In Electronics System Integration Technology Conference, ESTC 2010 - Proceedings [5642853] (Electronics System Integration Technology Conference, ESTC 2010 - Proceedings). https://doi.org/10.1109/ESTC.2010.5642853