A laboratory exafs study with higher-order bragg reflection by means of the fluorescence monitoring technique

Kazuhiko Omote, Kazuyuki Tohji, Yoshio Waseda

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

A Laboratory EXAFS study has been tested by using higher-order Bragg reflections of Ge(440), Ge(333) and Ge(444). A single crystal spectrometer was employed and the incident x-ray intensity was monitored by measuring the fluorescent radiation from a suitable material placed in front of a sample. Good EXAFS spectra were obtained for relatively heavy elements of Se, Y and Zr with this technique. In addition, high intensity photon fluxes have been obtained, which are 6 and 3 times stronger than the case of double-crystal spectrometer at photon energies of 12 and 16 keV, respectively.

Original languageEnglish
Pages (from-to)264-266
Number of pages3
JournalJapanese journal of applied physics
Volume32
DOIs
Publication statusPublished - 1993 Jan

Keywords

  • Fluorescence monitoring
  • Higher-order reflection
  • Laboratory EXAFS

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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