TY - JOUR
T1 - A laboratory exafs study with higher-order bragg reflection by means of the fluorescence monitoring technique
AU - Omote, Kazuhiko
AU - Tohji, Kazuyuki
AU - Waseda, Yoshio
PY - 1993/1
Y1 - 1993/1
N2 - A Laboratory EXAFS study has been tested by using higher-order Bragg reflections of Ge(440), Ge(333) and Ge(444). A single crystal spectrometer was employed and the incident x-ray intensity was monitored by measuring the fluorescent radiation from a suitable material placed in front of a sample. Good EXAFS spectra were obtained for relatively heavy elements of Se, Y and Zr with this technique. In addition, high intensity photon fluxes have been obtained, which are 6 and 3 times stronger than the case of double-crystal spectrometer at photon energies of 12 and 16 keV, respectively.
AB - A Laboratory EXAFS study has been tested by using higher-order Bragg reflections of Ge(440), Ge(333) and Ge(444). A single crystal spectrometer was employed and the incident x-ray intensity was monitored by measuring the fluorescent radiation from a suitable material placed in front of a sample. Good EXAFS spectra were obtained for relatively heavy elements of Se, Y and Zr with this technique. In addition, high intensity photon fluxes have been obtained, which are 6 and 3 times stronger than the case of double-crystal spectrometer at photon energies of 12 and 16 keV, respectively.
KW - Fluorescence monitoring
KW - Higher-order reflection
KW - Laboratory EXAFS
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U2 - 10.7567/JJAPS.32S2.264
DO - 10.7567/JJAPS.32S2.264
M3 - Article
AN - SCOPUS:30244452597
VL - 32
SP - 264
EP - 266
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
SN - 0021-4922
ER -