Abstract
A new method for measuring the ordinary and extraordinary refractive indices of liquid crystal materials was devised by considering multiple reflections and interference. The refractive indices can be obtained from the numerical fitting between measured values and calculated values of the amplitude ratios and phase differences. This method is effective for design of high-quality liquid crystal displays.
| Original language | English |
|---|---|
| Pages | 47-50 |
| Number of pages | 4 |
| Publication status | Published - 2007 Dec 1 |
| Event | 14th International Display Workshops, IDW '07 - Sapporo, Japan Duration: 2007 Dec 5 → 2007 Dec 5 |
Other
| Other | 14th International Display Workshops, IDW '07 |
|---|---|
| Country/Territory | Japan |
| City | Sapporo |
| Period | 07/12/5 → 07/12/5 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Electronic, Optical and Magnetic Materials
- Radiology Nuclear Medicine and imaging
- Atomic and Molecular Physics, and Optics