A high-sensitivity active magnetic probe using CMOS integrated circuits technology

Satoshi Aoyama, Shoji Kawahito, Takeshi Yasui, Masahiro Yamaguchi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

12 Citations (Scopus)

Abstract

A novel magnetic probe has been designed and fabricated in CMOS-SOI technology. Testing results show, for the first time, the effectiveness of the active magnetic probe with on-chip amplification, electric field suppression, and electrical switching.

Original languageEnglish
Title of host publication14th Topical Meeting on Electrical Performance of Electronic Packaging 2005
Pages103-106
Number of pages4
DOIs
Publication statusPublished - 2005 Dec 1
Event14th Topical Meeting on Electrical Performance of Electronic Packaging 2005 - Austin, TX, United States
Duration: 2005 Oct 242005 Oct 26

Publication series

NameIEEE Topical Meeting on Electrical Performance of Electronic Packaging
Volume2005

Other

Other14th Topical Meeting on Electrical Performance of Electronic Packaging 2005
CountryUnited States
CityAustin, TX
Period05/10/2405/10/26

Keywords

  • Active magnetic probe
  • CMOS-SOI
  • Near field measurement

ASJC Scopus subject areas

  • Engineering(all)

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