A high-resolution synchrotron-radiation angle-resolved photoemission spectrometer with in situ oxide thin film growth capability

K. Horiba, H. Ohguchi, H. Kumigashira, M. Oshima, K. Ono, N. Nakagawa, M. Lippmaa, M. Kawasaki, H. Koinuma

Research output: Contribution to journalArticle

94 Citations (Scopus)

Abstract

A study was performed on a high-resolution synchrotron-radiation angle-resolved photoemission (ARPES) spectrometer with in situ oxide thin film growth capability. It was used to investigate the electronic structure of transition metal oxide thin films. It was found that a momentum resolution of 0.02 Å-1 (0.2°) and a total energy resolution of 6.3 meV were obtained at a photon energy of 40 eV.

Original languageEnglish
Pages (from-to)3406-3412
Number of pages7
JournalReview of Scientific Instruments
Volume74
Issue number7
DOIs
Publication statusPublished - 2003 Jul 1
Externally publishedYes

ASJC Scopus subject areas

  • Instrumentation

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