A high-resolution measurement system for surface profile of electric contact

Yasuo Ebara; Hideaki Sone; Yoshiaki Nemoto; Tasuku Takagi

A high-resolution measurement system for surface profile of electric contact

Yasuo Ebara, Hideaki Sone, Yoshiaki Nemoto, Tasuku Takagi

Research and Development Divisions

Research output: Contribution to journal › Article › peer-review

4 Citations (Scopus)

Abstract

We discussed on relationship between the width of slit ray and the accuracy of the measurement system for surface profile of electric contact. To obtain resolution of 10 [μm], we designed the mechanism which keeps constant the focal length between the object and the lens. As a result, the width of slit ray was clear in the whole surface. A section image could measured exactly and enhanced the resolution.

Original language	English
Pages (from-to)	432-434
Number of pages	3
Journal	IEICE Transactions on Electronics
Volume	E81-C
Issue number	3
Publication status	Published - 1998

Keywords

Electric contact
Focal length
High-resolution
Surface profile measurement

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

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title = "A high-resolution measurement system for surface profile of electric contact",

abstract = "We discussed on relationship between the width of slit ray and the accuracy of the measurement system for surface profile of electric contact. To obtain resolution of 10 [μm], we designed the mechanism which keeps constant the focal length between the object and the lens. As a result, the width of slit ray was clear in the whole surface. A section image could measured exactly and enhanced the resolution.",

keywords = "Electric contact, Focal length, High-resolution, Surface profile measurement",

author = "Yasuo Ebara and Hideaki Sone and Yoshiaki Nemoto and Tasuku Takagi",

year = "1998",

language = "English",

volume = "E81-C",

pages = "432--434",

journal = "IEICE Transactions on Electronics",

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TY - JOUR

T1 - A high-resolution measurement system for surface profile of electric contact

AU - Ebara, Yasuo

AU - Sone, Hideaki

AU - Nemoto, Yoshiaki

AU - Takagi, Tasuku

PY - 1998

Y1 - 1998

N2 - We discussed on relationship between the width of slit ray and the accuracy of the measurement system for surface profile of electric contact. To obtain resolution of 10 [μm], we designed the mechanism which keeps constant the focal length between the object and the lens. As a result, the width of slit ray was clear in the whole surface. A section image could measured exactly and enhanced the resolution.

AB - We discussed on relationship between the width of slit ray and the accuracy of the measurement system for surface profile of electric contact. To obtain resolution of 10 [μm], we designed the mechanism which keeps constant the focal length between the object and the lens. As a result, the width of slit ray was clear in the whole surface. A section image could measured exactly and enhanced the resolution.

KW - Electric contact

KW - Focal length

KW - High-resolution

KW - Surface profile measurement

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M3 - Article

AN - SCOPUS:0032025092

VL - E81-C

SP - 432

EP - 434

JO - IEICE Transactions on Electronics

JF - IEICE Transactions on Electronics

SN - 0916-8524

IS - 3

ER -

A high-resolution measurement system for surface profile of electric contact

Abstract

Keywords

ASJC Scopus subject areas

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